1. Statistical Reference Guide
  2. Process capability

Process capability

Capability analysis measures the ability of a process to meet specifications when the process is in statistical control.

A process must be in control before attempting to assess the capability. An out-of-control process is unpredictable and not capable of been characterized by a probability distribution.

Most process capability indices assume a normally distributed quality characteristic. If the distribution is non-normal, it may be possible to transform the data to be normally distributed. The process mean and process sigma define the normal distribution.

Capability indices are either "long-term" or "short-term" depending on the definition of the process sigma:
  • Long-term indices measure the process performance and represent the quality the end-user experiences. They are computed using the process sigma that includes both within-subgroup and between-subgroup variation (the standard deviation of the individual measurements).
  • Short-term indices measure the potential process performance ignoring differences between subgroups. They are computed using the process sigma that includes only within-subgroup variation (the Xbar-, R-, S-, or MR- control chart process sigma).

If the process is stable over time, the estimates of short-term sigma and long-term sigma are very similar. They are both estimates of the same parameter, although statistically speaking the long-term sigma is a slightly more efficient estimator.

However, if there are any changes in the process mean over time, the estimate of long-term sigma is greater than that of short-term sigma. The larger the difference between the values of long-term and short-term indices, the more opportunity there is to improve the process by eliminating drift, shifts and other sources of variation.

Note: There is much confusion over the meaning of the phrases long-term and short-term. It is important not to confuse them with the collection period of the sample data.

Capability ratios (Cp/Pp indices)

Capability ratios (Cp/Pp) describe the variability of a process relative to the specification limits.

A capability ratio is a unit-less value describing the ratio of process distribution spread to specification limits spread. A value of less than 1 is unacceptable, with values greater than 1.33 (1.25 for one-sided specification limits) widely accepted as the minimum acceptable value, and values greater than 1.50 (1.45 for one-sided specification limits) for critical parameters (Montgomery, 2012). The higher the value, the more capable the process of meeting specifications. A value of 2 or higher is required to achieve Six Sigma capability which is defined as the process mean not closer than six standard deviations from the nearest specification limit.

All of the indices assume a normally distributed process quality characteristic with the parameters specified by the process mean and sigma. The process sigma is either the short-term or long-term sigma estimate.

Indices computed using the short-term sigma estimate are called Cp indices (Cp, Cpl, Cpu, Cpk, Cpm). While those using long-term sigma estimate are called Pp indices (Pp, Ppl, Ppu, Ppk, Ppm). If the Cp indices are much smaller than the Pp indices, it indicates that there are improvements you could make by eliminating shifts and drifts in the process mean.

Various indices measure how the process is performing against the specification limits:
Index Purpose
Cp/Pp Estimates the capability of a process if the process mean were to be centered between the specification limits.
Note: If the process mean is not centered between the specification limits the value is only the potential capability, and you should not report it as the capability of the process.
Cpl/Ppl Estimates the capability of a process to meet the lower specification limit. Defined as how close the process mean is to the lower specification limit.
Cpu/Ppu Estimates the capability of a process to meet the upper specification limit. Defined as how close the process mean is to the upper specification limit.
Cpk/Ppk Estimates the capability of a process, considering that the process mean may not be centered between the specification limits. Defined as the lesser of Cpl and Cpu.
Note: If Cpk is equal to Cp, then the process is centered at the midpoint of the specification limits. The magnitude of Cpk relative to Cp is a measure of how off center the process is and the potential improvement possible by centering the process.
Cpm/Ppm Estimates the capability of a process, and is dependent on the deviation of the process mean from the target.
Note: Cpm increases as the process mean moves towards the target. Cpm, Cpk, and Cp all coincide when the target is the center of the specification limits and the process mean is centered.
Note: There is some confusion between terms "Cp" and "Pp" as some authors suggest the use of Pp indices when a process is not-in-control and Cp indices when a process is in control. However, it is nonsense to interpret the indices when the process is not-in-control as no probability distribution can describe the process performance. We make the distinction between Pp and Cp indices on the estimate of sigma used not on the state of the process.

Z benchmark

Z benchmark describes the sigma capability of a process.

Z benchmark indices are an alternative to Cp and Pp indices. They are the definition of the sigma capability of a Six Sigma process.

All of the indices assume a normally distributed process quality characteristic with the parameters specified by the process mean and sigma. The process sigma is either the short-term or long-term sigma estimate.

Various indices measure how the process is performing against the specification limits:
Index Description
< LSL The number of sigma units from the process mean to the lower specification limit.
> USL The number of sigma units from the process mean to the upper specification limit.
< SL > The number of sigma units from the process to mean to the point if all nonconforming units are put in one tail of the distribution.

Z shift is the difference between the short-term and long-term indices. The larger the Z shift, the more scope there is to improve the process by eliminating shifts and drifts in the process mean. Some industries define the sigma capability of a process as the long-term Z benchmark + a 1.5 Z shift. Meaning a process with a long-term Z benchmark of 4.5 is quoted as a Six Sigma process. It is best to avoid such rules and directly measure the short-term and long-term Z benchmark capability.

Nonconforming units

Nonconforming units describe the number of nonconforming units a process produces, expressed in parts per million.

The number of nonconforming units is an alternative to traditional Cp and Pp indices. They are easily understandable by end-users.

The number of nonconforming units is either:
  • The actual number of nonconforming units in the sample.
  • The expected number of nonconforming units, assuming a normally distributed process quality characteristic with the parameters specified by the process mean and sigma. The process sigma is either the short-term or long-term sigma estimate.
Various indices measure how the process is performing against the specification limits:
Index Description
< LSL The number of nonconforming units that are less than the lower specification limit.
> USL Thr number of nonconforming units that are greater than the upper specification limit.
< SL > The total number of nonconforming units that are outside the specification limits.

Estimating process capability

Plot a process capability histogram and compute indices to determine if a process can meet specifications.

This task creates a new process capability analysis report. You can also estimate the process capability directly from a process control analysis report using the Capability command in the Process Capability group on the Analyse-it ribbon tab.
  1. Select a cell in the dataset.
  2. On the Analyse-it ribbon tab, in the Statistical Analyses group, click Capability, and then click:
    Option Description
    3-up Compute capability ratios and plot a histogram and univariate plot.
    4-up Compute capability ratios and plot a histogram, univariate plot, and normal probability plot.
    6-up Compute capability ratios and plot a histogram, univariate plot, normal probability plot and control charts.
    The analysis task pane opens.
  3. In the Model drop-down menu:
    • If the data are individual observations, select Process variable .
    • If the data are rational subgroups, select Process variable with Subgroups.
  4. In the Process drop-down list, select the quality characteristic variable.
  5. If the data are collected in subgroups, in the Sample size group:
    • If the subgroups are identified by a variable, select Subgroup by identifier variable, and in the Id drop-down list, select the subgroup identifier variable.
    • If the subgroups are a constant size and formed by consecutive number of observations of the process variable, Subgroup size constant, and in the edit box, enter the number of consecutive observations per subgroup.
  6. Optional: If the data are individual observations, in the Id drop-down list, select an identifier variable
  7. In either or both the LSL and USL edit boxes, type the lower and upper specification limits.
  8. Optional: In the Target edit box, type the target value.
  9. Optional: If you are using control charts, in the Sigma estimator drop-down list, select:
    Option Description
    Long-term Use the overall standard deviation of the individual measurements.
    Short-term Use the within-subgroup sigma of the process (using the process control R-, S-, or MR- chart).
  10. Select the Capability ratios, Z benchmark, or Nonconforming units check boxes.
  11. Click Calculate.

Statistical Reference Guide v6.15